Materials Characterisation
Avacta Analytical offers a variety of specific applications for characterisation of products in the materials industry as well as access to general analytical services and techniques including, Raman mapping, XPS, Auger spectroscopy, ellipsometry, SPR, AFM and electron microscopy / spectroscopy.
If there is a specific application or service you need, but don't see, please contact us directly to discuss your individual requirements.
Some of the applications our clients use Avacta for include:
- Surface characterisation of carbon fibre or composite material
- Analysis of residual stress in damaged silicon wafer