Scanning Electron Microscopy
Spatial Resolution: ~1-4 nm
Provides wide range of information - both topographic & chemical
Sample must be stable in a vacuum environment and be electrically conductive
Non-conducting specimens can be coated with a thin layer of gold or carbon to facilitate examination
Many samples and beam sensitive specimens can be examined uncoated at low voltage using a high resolution FEGSEM
Facilities include
High resolution FEGSEM equipped with ED X-ray analysis and a nanolithography package, CryoSEM, ESEM and a wide range of other SEM equipment complimented with a wide range of sample preparation techniques and a high level of expertise.